DIN 50440:1995-12
Superseded Draft standard
Historical

DIN 50440:1995-12

Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 12/01/1995
Page Count 8
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ISBN ---
Weight (in grams) ---
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