DIN 50448:1998-01
Withdrawn Standard
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DIN 50448:1998-01

Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 01/01/1998
Page Count 8
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ISBN ---
Weight (in grams) ---
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