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DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a galvanic cell
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Summary
The standard should define the test method for determining the content of O2 in the carrier and doping gases N2, Ar, He, Ne and H2.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/1991 |
| Page Count | 2 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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