DIN 50454-1:2000-07
Withdrawn Standard
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DIN 50454-1:2000-07

Testing of materials for semiconductor technology - Determination of dislocations in monocrystals of III-V-compound semi-conductors - Part 1: Gallium arsenide
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 07/01/2000
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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