DIN 51096:2008-07
Superseded Standard
Historical

DIN 51096:2008-07

Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
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Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 07/01/2008
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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