DIN 51457:2023-11
Superseded Draft standard
Historical

DIN 51457:2023-11

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
Most recent standard
No description.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 11/01/2023
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

Previous versions

DIN 51457:2024-07

DIN 51457:2024-07

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP-OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifier)
01/07/2024
Active
Most Recent
DIN 51457:2023-11

DIN 51457:2023-11

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
01/11/2023
Superseded
Historical
DIN 51457:2017-05

DIN 51457:2017-05

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
01/05/2017
Superseded
Historical
DIN 51457:2016-11

DIN 51457:2016-11

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP-OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
01/11/2016
Superseded
Historical
DIN 51457:2015-05

DIN 51457:2015-05

Testing of ceramic raw and basic materials - Direct determination of mass fractions of trace impurities in powders, granules and lumps of graphite by optical emission spectroscopy by inductively coupled plasma (ICP-OES) and by electrothermal vaporization (ETV) under the action of a halogenated reaction gas (modifiers)
01/05/2015
Superseded
Historical
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