DIN EN 15991:2024-07
Superseded Draft standard
Historical

DIN EN 15991:2024-07

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024
Most recent standard
No description.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 07/01/2024
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

Previous versions

DIN EN 15991:2025-11

DIN EN 15991:2025-11

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German version EN 15991:2025
01/11/2025
Active
Most Recent
DIN EN 15991:2024-07

DIN EN 15991:2024-07

Testing of ceramic raw materials and ceramic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry with electrothermal vaporisation (ETV-ICP-OES); German and English version prEN 15991:2024
01/07/2024
Superseded
Historical
DIN EN 15991:2016-02

DIN EN 15991:2016-02

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2015
01/02/2016
Superseded , Has Draft
Historical
DIN EN 15991:2014-07

DIN EN 15991:2014-07

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version prEN 15991:2014
01/07/2014
Superseded
Historical
DIN EN 15991:2011-04

DIN EN 15991:2011-04

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV); German version EN 15991:2011
01/04/2011
Superseded
Historical
DIN EN 15991:2009-09

DIN EN 15991:2009-09

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of non-oxidic ceramic raw and basic materials by inductively coupled plasma optical emission spectroscopy (ICP OES) with electrothermal vaporisation (ETV); German version prEN 15991:2009
01/09/2009
Superseded
Historical
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