Superseded
Standard
Historical
DIN EN 60749-10:2003-04
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock (IEC 60749-10:2002); German version EN 60749-10:2002.
Preview
Summary
This part of DIN EN 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation or field operation.
Notes
Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN IEC 60749-10 (2023-12), exists until 2025-06-01.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 04/01/2003 |
| Page Count | 7 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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