DIN EN 60749:2001-09
Superseded Standard
Historical

DIN EN 60749:2001-09

Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000); German version EN 60749:1999 + A1:2000.
Most recent standard
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Notes

DIN EN 60749 (2000-02) remains valid alongside this standard until 2003-09-01.*A transition period, as set out in DIN EN 60749 (2002-09), exists until 2004-12-01.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 09/01/2001
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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