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DIN EN 60749-23/A1:2009-09
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 47/2017/CDV:2009); German version EN 60749-23:2004/FprA1:2009
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2009 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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