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DIN EN 60749-44:2014-08
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 47/2193/CD:2014)
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Summary
This part of DIN EN 60749 establishes a procedure for measuring the single event effects on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to terrestrial cosmic rays.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 08/01/2014 |
| Cancellation Date | 04/01/2017 |
| Page Count | 33 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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