DIN EN 60749-7:2003-04
Superseded Standard
Historical

DIN EN 60749-7:2003-04

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases (IEC 60749-7:2002); German version EN 60749-7:2002.
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Notes

Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN 60749-7 (2012-02), exists until 2014-07-22.

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 04/01/2003
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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