Superseded Draft standard
Historical

DIN EN 62047-14:2010-10

Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (IEC 47F/59/CD:2010)
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Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 10/01/2010
Page Count 8
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