Superseded
Draft standard
Historical
DIN EN 62435-2:2013-10
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013)
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Summary
This part of the series of standards DIN EN 62435 is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess these Deterioration Mechanisms for specific component types.
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 10/01/2013 |
| Cancellation Date | 10/01/2017 |
| Page Count | 22 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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