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DIN EN IEC 60749-30:2019-09
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 47/2562/CDV:2019); German version prEN IEC 60749-30:2019
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| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 09/01/2019 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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