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DIN EN IEC 63364-1:2025-01
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection (IEC 63364-1:2022); German version EN IEC 63364-1:2023
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| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/2025 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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