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DIN IEC 47(CO)1044:1989-01
Digital integrated circuits; terms and description of test patterns for memory testing; identical with IEC 47(Central Office)1044
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 01/01/1989 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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