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DIN IEC 47(CO)1053-2:1989-03
Semiconductor devices; internal visual examination; procedure for discrete semiconductors; identical with IEC 47(Central Office)1053-II
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 03/01/1989 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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