Superseded
Draft standard
Historical
DIN IEC 47(CO)1252:1992-07
Semiconductor devices; mechanical and climatic test method; internal moisture content measurement by mass spectrometry method; identical with IEC 47(Central Office)1252
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 07/01/1992 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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