Superseded
Draft standard
Historical
DIN IEC 47D/221/CDV:1998-08
Semiconductor devices, mechanical standardization - QFP measuring method (IEC 47D/221/CDV:1998)
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 08/01/1998 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/08/1998
Superseded
Historical