Superseded
Draft standard
Historical
DIN IEC 60749-35:2004-12
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
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Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 12/01/2004 |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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