DIN IEC 62215-3:2010-05

This standard defines a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test, are applied to the IC pins via coupling networks. This method enables an understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs while the transients are within or outside the specified voltage operating range.