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IEC 61163-1:2006
IEC 61163-1:2006 Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
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Summary
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 06/26/2006 |
| Edition | 2.0 |
| Page Count | 161 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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26/06/2006
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