IEC 62435-2:2017
Active Standard
Most Recent

IEC 62435-2:2017

IEC 62435-2:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

Summary

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

Technical characteristics

Publisher International Electrotechnical Commission (IEC)
Publication Date 01/24/2017
Edition 1.0
Page Count 36
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us