IEEE 1445:1998 (R2009)

New IEEE Standard - Superseded.
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.

This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.
This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.