Withdrawn
Standard
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IEEE 1545:1999
IEEE Standard for Parametric Data Log Format
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Summary
New IEEE Standard - Inactive-Withdrawn.
Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.
This standard will define the file and record formats for parametric test data acquired during a test operation. This standard supports and is part of the IEEE 1226 family of standards.
The purpose of this standard is to provide a means to log parametric data so that the data can be exchanged for the purpose of analysis and historical trend reporting.
Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.
This standard will define the file and record formats for parametric test data acquired during a test operation. This standard supports and is part of the IEEE 1226 family of standards.
The purpose of this standard is to provide a means to log parametric data so that the data can be exchanged for the purpose of analysis and historical trend reporting.
Notes
Inactive-Withdrawn
Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 11/15/1999 |
| Cancellation Date | 01/25/2005 |
| Edition | |
| Page Count | 36 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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