ISO 17470:2014 (R2019)
Active , Confirmed Standard
Most Recent

ISO 17470:2014 (R2019)

Microbeam analysis — Electron probe microanalysis — Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Summary

ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a µm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

Notes

90.60 : Clôture de l'examen

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 01/06/2014
Confirmation Date 06/06/2019
Edition 2
Page Count 10
EAN ---
ISBN ---
Weight (in grams) ---
No products.

Previous versions

Contact us