ISO 18452:2005 (R2025)
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ISO 18452:2005 (R2025)

Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

Summary

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

Notes

90.20 : Norme internationale en cours d'examen systématique

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 11/16/2005
Confirmation Date 03/13/2025
Edition 1
Page Count 9
EAN ---
ISBN ---
Weight (in grams) ---
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