ISO 11505:2025
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ISO 11505:2025

Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

Summary

ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.

Notes

40.20 : Mise au vote du DIS: 12 semaines

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 06/19/2025
Edition 2
Page Count 34
EAN ---
ISBN ---
Weight (in grams) ---

Replaces

Previous versions

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