ISO 16666:2025
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ISO 16666:2025

Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements

Summary

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

Notes

40.00 : DIS enregistré

Technical characteristics

Publisher International Organization for Standardization (ISO)
Publication Date 11/07/2025
Edition 1
Page Count 22
EAN ---
ISBN ---
Weight (in grams) ---
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