Superseded Standard
Historical

NBN EN ISO 9220:1995

Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

Summary

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Technical characteristics

Publisher Bureau de Normalisation Belge (NBN)
Publication Date 02/17/1995
Cancellation Date 04/30/1995
Page Count 12
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