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NF EN IEC 63287-2, C96-287-2 (05/2023)
Dispositifs à semiconducteurs - Lignes directrices concernant les plans de qualification de la fiabilité - Partie 2 : concept de profil de mission
Automatic translation from French :
Semiconductor devices - Guidance for reliability qualification plans - Part 2: Mission profile concept
Automatic translation from French :
Semiconductor devices - Guidance for reliability qualification plans - Part 2: Mission profile concept
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Technical characteristics
| Publisher | Association Française de Normalisation (AFNOR) |
| Publication Date | 05/01/2023 |
| Release Date | 05/01/2023 |
| Page Count | 20 |
| Themes | Electrotechnologies |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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