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PD IEC/TS 62878-2-4:2015
Device embedded substrate Guidelines. Test element groups (TEG)
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Summary
Damp-heat tests;Automatic control systems;Stability;Test equipment;Performance testing;Testing conditions;Grades (quality);Thermal testing;Environmental testing;Control systems;Transmitters;Accuracy;Installation;Flow measurement;Classification systems;Dynamic testing;Transducers;Safety measures;Drop tests;Mechanical testing;Electric power system disturbances;Accelerated testing;Maintenance;Process control;Impact testing;Interfaces (data processing);Technical documents;Industrial;Vibration testing;Electrical testing
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2015 |
| Page Count | 40 |
| Themes | Electrical testing |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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30/04/2015
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