SAE AS 6171/2A:2017-05-11

This document describes the requirements of the following test methods for counterfeit detection of electronic components:

1. a
   Method A: General EVI, Sample Selection, and Handling
2. b
   Method B: Detailed EVI, including Part Weight measurement
3. c
   Method C: Testing for Remarking
4. d
   Method D: Testing for Resurfacing
5. e
   Method E: Part Dimensions measurement
6. f
   Method F: Surface Texture Analysis using SEM

The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply.