Superseded
Standard
Historical
SAE J 1752/1:2006-10-13
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions
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Summary
Scope This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Rationale:
Rationale
The intent of this document is to define general test conditions to establish a uniform testing environment and obtain a quantitative measure of the RF emissions from ICs. Critical parameters that are expected to influence the test results are described in this document and any deviations shall be documented in the test report. This revision is being implemented to support advances in the individual; test methods.
Rationale:
Rationale
The intent of this document is to define general test conditions to establish a uniform testing environment and obtain a quantitative measure of the RF emissions from ICs. Critical parameters that are expected to influence the test results are described in this document and any deviations shall be documented in the test report. This revision is being implemented to support advances in the individual; test methods.
Technical characteristics
| Publisher | SAE International |
| Publication Date | 10/13/2006 |
| Cancellation Date | 10/13/2006 |
| Page Count | 17 |
| Themes | Automotive |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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