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SAE J 2052:2016-07-12

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

Summary

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Technical characteristics

Publisher SAE International
Publication Date 07/12/2016
Page Count 7
Themes Automotive
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