Superseded
Standard
Historical
VDE/VDI 2604*VDI/VDE 2604:1971-06
Surface measuring methods; roughness analysis by means of interference microscopy
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Summary
Oberflächen-Meßverfahren; Rauheitsuntersuchung mittels Interferenzmikroskopie
Technical characteristics
| Publisher | Deutsche Institut für Normung e.V. (DIN) |
| Publication Date | 06/01/1971 |
| Cancellation Date | 10/01/2010 |
| Page Count | 11 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/06/1971
Superseded
Historical