BS EN IEC 60146-1-1. Semiconductor converters. General requirements and line commutated converters Part 1-1. Specification of basic
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BS IEC 62899-203-2 Printed electronics Materials - Semiconductor Ink- Space charge limited mobility measurement in printed organic semiconductive layers
Printed electronics Materials. Semiconductor ink
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Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
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Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
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Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Test Method for Crystallographic Perfection of Epitaxial Deposits of Silicon by Etching Techniques (Withdrawn 1998)
Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)
Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
Standard Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique (Withdrawn 2003)
Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
