31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS 9364 N011:1978

BS 9364 N011:1978

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€172.00

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BS 9364 N012:1978

BS 9364 N012:1978

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

€172.00

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BS 9364 N013:1979

BS 9364 N013:1979

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€172.00

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BS 9364 N016:1979

BS 9364 N016:1979

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€172.00

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BS 9364 N017:1979

BS 9364 N017:1979

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

€172.00

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BS 9370:1983

BS 9370:1983

Withdrawn Most Recent

Specification for capability approval of light emitting and infra-red diode arrays of assessed quality: generic data and methods of test

€281.00

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BS EN 150001:1993

BS EN 150001:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes

€201.00

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BS EN 150010:1993

BS EN 150010:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors

€201.00

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BS EN 150011:1993

BS EN 150011:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors

€201.00

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BS EN 150012:1993

BS EN 150012:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors

€370.00

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BS EN 150013:1993

BS EN 150013:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: current regulator and current reference diodes

€201.00

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BS 6493-3:1985

BS 6493-3:1985

Superseded Historical

Semiconductor devices Mechanical and climatic test methods

€329.00

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BS E9372:1976

BS E9372:1976

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification

€201.00

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BS EN 150003:1993

BS EN 150003:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated bipolar transistors for low frequency amplification

€201.00

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BS EN 150004:1993

BS EN 150004:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: bipolar transistors for switching applications

€201.00

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