Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics MEMS piezoelectric thin film
€281.00
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
€201.00
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress (HAST)
DC or AC supplied electronic controlgear for LED modules. Performance requirements
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
€421.00
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
€172.00
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements
€390.00
Mechanical standardization of semiconductor devices Coding system and classification into forms package outlines for device packages
€329.00
Semiconductor devices bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification
