31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS IEC 60747-18-2:2020

BS IEC 60747-18-2:2020

Active Most Recent

Semiconductor devices bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules

€201.00

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BS EN IEC 60749-26:2018

BS EN IEC 60749-26:2018

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

€390.00

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BS EN IEC 60749-13:2018

BS EN IEC 60749-13:2018

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Salt atmosphere

€201.00

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BS EN IEC 60749-12:2018

BS EN IEC 60749-12:2018

Active Most Recent

Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

€172.00

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BS IEC 60747-18-3:2019

BS IEC 60747-18-3:2019

Active Most Recent

Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

€281.00

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PD IEC/TR 63133:2017

PD IEC/TR 63133:2017

Active Most Recent

Semiconductor devices. Scan based ageing level estimation for semiconductor devices

€201.00

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BS IEC 60747-14-11:2021

BS IEC 60747-14-11:2021

Active Most Recent

Semiconductor devices sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

€281.00

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BS IEC 62047-36:2019

BS IEC 62047-36:2019

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films

€201.00

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BS IEC 62779-4:2020

BS IEC 62779-4:2020

Active Most Recent

Semiconductor devices. interface for human body communication Capsule endoscope

€191.00

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BS IEC 62047-35:2019

BS IEC 62047-35:2019

Active Most Recent

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical

€281.00

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BS IEC 63150-1:2019

BS IEC 63150-1:2019

Active Most Recent

Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations

€329.00

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17/30366375 DC:2017

17/30366375 DC:2017

Active Most Recent

BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method

€24.00

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BS IEC 62373-1:2020

BS IEC 62373-1:2020

Active Most Recent

Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Fast BTI MOSFET

€281.00

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BS IEC 63068-2:2019

BS IEC 63068-2:2019

Active Most Recent

Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection

€281.00

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PD IEC/TR 62258-7:2007

PD IEC/TR 62258-7:2007

Active Most Recent

Semiconductor die products XML schema for data exchange

€281.00

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