Semiconductor devices. Mechanical and climatic test methods Low air pressure
€172.00
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
€201.00
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Bond strength
€281.00
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods shock
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
€370.00
Teleweb application Superteletext profile
€421.00
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings surface mounted device packages Dimensions P-VSON
Mechanical standardization of semiconductor devices. General rules for the preparation outline drawings surface mounted device packages Design guide 1,50 mm, 1,27 mm and 1,00 pitch ball column terminal
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
