Semiconductor devices; additional essential ratings and characteristics for microwave field effect transistors into IEC 60747-4 (IEC 47E(Secretariat)3:1993)
€41.78
Semiconductor devices; revised and additional measuring methods for microwave field effect transistors; amendment to IEC 47(Central Office)1261 (IEC 47E(Secretariat)4:1993)
Semiconductor devices; measuring methods for thyristors; revision of IEC 747-6, chapter IV (IEC 47(Secretariat)1322:1993)
€91.03
Semiconductor devices; supplement to IEC 60747-7: bipolar transistors, pulse methods for collector-base cutt-off current and emitter-base cutt-off current (IEC 47E(Secretariat)5:1993)
Semiconductor devices; additional ratings and characteristics and measuring methods for power switching bipolar transistors (IEC 47(Secretariat)1275:1992)
Semiconductor devices; amendments of the rules for subscripts and indication of polarity (IEC 47(Central Office)1336:1992)
€34.30
Semiconductor devices - Visual inspection of discrete semiconductor devices (IEC 47E(Secretariat)6:1994)
€214.30
Mechanical standardization of semiconductor devices
€281.00
Semiconductor devices. Discrete devices Microwave diodes and transistors. Integrated-circuit microwave amplifiers. Blank detail specification
€201.00
Environmental testing. Test methods Db and guidance: damp heat, cyclic (12 + 12 hour cycle)
Discrete semiconductor devices and integrated circuits. Semiconductor devices. sensors General classification Sensor generals for
€172.00
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life
Data requirements for semiconductor die. Exchange data formats and dictionary exchange. DDX file format
€329.00
Data requirements for semiconductor die. Specific and recommendations Electrical simulation
Data requirements for semiconductor die. Specific and recommendations Thermal
