31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UTE C96-315, C96-315U (12/1988)

UTE C96-315, C96-315U (12/1988)

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Microcircuits. Microwave devices. Attenuators. General article sheets. - Dispositifs hyperfréquences

€123.00

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UTE C96-315/A1, C96-315/A1U (02/1989)

UTE C96-315/A1, C96-315/A1U (02/1989)

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Additif 1 à la publication UTE C 96-315 de décembre 1988

€162.33

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NF C96-036 (01/1992) (R2012)

NF C96-036 (01/1992) (R2012)

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Binary floating-point arithmetic for microprocessor systems.

€93.33

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NF C96-318 (03/1991)

NF C96-318 (03/1991)

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Dispositifs hyperfréquences - Lignes à retard actives

€77.67

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NF C96-032 (01/1992) (R2012)

NF C96-032 (01/1992) (R2012)

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IEC 822 VSB. Parallel sub-system bus of the IEC 821 VMEBUS.

€246.67

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NF C96-001 (07/1984) (R2014)

NF C96-001 (07/1984) (R2014)

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Electronic components. Semiconductor devices. Discrete devices and integrated circuits. Part 1 : general.

€149.33

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UTE C86-614/A9, C86-614/A9U (03/1986)

UTE C86-614/A9, C86-614/A9U (03/1986)

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Additif 9 à la publication UTE C 86-614 de février 1977

€76.00

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UTE C86-614/A10, C86-614/A10U (04/1987)

UTE C86-614/A10, C86-614/A10U (04/1987)

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Additif 10 à la publication UTE C 86-614 de février 1977

€162.33

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NF EN 60617-5, C03-205 (03/1997)

NF EN 60617-5, C03-205 (03/1997)

Withdrawn Most Recent

Graphical symbols for diagrams. Part 5 : semiconductors and electron tubes. - GRAPHISCHE SMBOLE FUER SCHALTPLAENE. TEIL 5 : SCHALTZEICHEN FUER HALBLEITER UND ELEKTRONENROEHREN. (EUROPAEISCHE NORM EN 60 617-5).

€143.80

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NF EN 62007-1, C93-801-1 (10/2015)

NF EN 62007-1, C93-801-1 (10/2015)

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Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics

€107.86

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NF EN 62047-25, C96-050-25 (12/2016)

NF EN 62047-25, C96-050-25 (12/2016)

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Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area

€106.33

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NF EN 62047-16, C96-050-16 (11/2015)

NF EN 62047-16, C96-050-16 (11/2015)

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Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

€74.00

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NF EN 62047-26, C96-050-26 (06/2016)

NF EN 62047-26, C96-050-26 (06/2016)

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Semiconductor devices - Micro-electromechanical devices - Part 26 : description and measurement methods for micro trench and needle structures

€123.00

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NF EN IEC 60749-12, C96-022-12 (03/2018)

NF EN IEC 60749-12, C96-022-12 (03/2018)

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Semiconductor devices - Mechanical and climatic test methods - Part 12 : vibration, variable frequency

€58.00

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NF EN IEC 60749-13, C96-022-13 (04/2018)

NF EN IEC 60749-13, C96-022-13 (04/2018)

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Semiconductor devices - Mechanical and climatic test methods - Part 13 : salt atmosphere

€93.33

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