Normadoc

NF EN 60749-23, C96-022-23 (07/2004)

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life - Dispositifs à semiconducteurs

€58.00

NF EN 60749-24, C96-022-24 (12/2005)

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 24 : accelerated moisture resistance - Unbiased HAST - Dispositifs à semiconducteurs

€68.67

NF EN 60749-33, C96-022-33 (12/2005)

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 33 : accelerated moisture resistance - unbiased autoclave - Dispositifs à semiconducteurs

€68.67

NF EN 60747-16-1, C96-016-1 (07/2003)

Active Most Recent

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

€145.67

NF EN 60747-16-3, C96-016-3 (07/2003)

Active Most Recent

Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters

€119.00

NF EN 60749-32, C96-022-32 (11/2003)

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced) - Dispositifs à semiconducteurs

€42.67

NF EN 60749-30, C96-022-30 (06/2005)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing - Dispositifs à semiconducteurs

€74.00

NF EN 60747-16-1/A1, C96-016-1/A1 (05/2013)

Active Most Recent

Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers

€106.33

NF EN 60191-6-16, C96-013-6-16 (01/2013)

Active Most Recent

Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-16 : glossaire des supports de test et de déverminage pour les BGA, LGA, FBGA et FLGA

€91.00

NF EN 62374, C96-017 (01/2008)

Active Most Recent

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films - Dispositifs à semiconductors

€87.39

NF EN 60749-35, C96-022-35 (12/2006)

Active Most Recent

Semiconductor devices - Mechanical and climatic test methods - Part 35 : acoustic microscopy for plastic encapsulated electronic components - Dispositifs à semiconducteurs

€93.33

NF EN 62258-6, C96-034-6 (12/2006)

Active Most Recent

Semiconductor die products - Part 6 : requirements for information concerning thermal simulation

€62.50

NF EN 60749-39, C96-022-39 (12/2006)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dispositifs à semiconducteurs

€91.00

NF EN 60749-37, C96-022-37 (07/2008)

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 37 : board level drop test method using an accelerometer - Dispositifs à semiconducteurs

€106.33

NF EN 62031, C71-250 (12/2008)

Superseded Historical

LED modules for general lighting - Safety specifications - Modules de del pour éclairage général

€91.00

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31.080 : Semiconductor devices

31.080.01

31.080.10

31.080.20

31.080.30

31.080.99

NF EN 60749-23, C96-022-23 (07/2004)

NF EN 60749-24, C96-022-24 (12/2005)

NF EN 60749-33, C96-022-33 (12/2005)

NF EN 60747-16-1, C96-016-1 (07/2003)

NF EN 60747-16-3, C96-016-3 (07/2003)

NF EN 60749-32, C96-022-32 (11/2003)

NF EN 60749-30, C96-022-30 (06/2005)

NF EN 60747-16-1/A1, C96-016-1/A1 (05/2013)

NF EN 60191-6-16, C96-013-6-16 (01/2013)

NF EN 62374, C96-017 (01/2008)

NF EN 60749-35, C96-022-35 (12/2006)

NF EN 62258-6, C96-034-6 (12/2006)

NF EN 60749-39, C96-022-39 (12/2006)

NF EN 60749-37, C96-022-37 (07/2008)

NF EN 62031, C71-250 (12/2008)