Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
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Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Standard Specification for Gold Wire for Semiconductor Lead Bonding
€72.00
€65.00
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
€201.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
€421.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Ambient rated photocouplers with phototransistor output
€281.00
IEC 60747-6:2016 Semiconductor devices - Part 6: Discrete devices - Thyristors
€499.00
IEC 60747-2:2016 Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
€342.00
IEC 62779-3:2016 Semiconductor devices - Semiconductor interface for human body communication - Part 3: Functional type and its operational conditions
€93.00
IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
€186.00
