31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 62047-25:2016

IEC 62047-25:2016

Active Most Recent

IEC 62047-25:2016 Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area

€186.00

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IEC 61975:2010/AMD1:2016

IEC 61975:2010/AMD1:2016

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IEC 61975:2010/AMD1:2016 Amendment 1 - High-voltage direct current (HVDC) installations - System tests

€133.00

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IEC 60191-6-13:2016

IEC 60191-6-13:2016

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IEC 60191-6-13:2016 Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)

€133.00

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IEC 62830-2:2017

IEC 62830-2:2017

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IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting

€93.00

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IEC 60747-16-1:2001/AMD2:2017

IEC 60747-16-1:2001/AMD2:2017

Active Most Recent

IEC 60747-16-1:2001/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers

€23.00

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IEC 62830-1:2017

IEC 62830-1:2017

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IEC 62830-1:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting

€186.00

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IEC 61954:2011/AMD2:2017

IEC 61954:2011/AMD2:2017

Superseded Historical

IEC 61954:2011/AMD2:2017 Amendment 2 - Static var compensators (SVC) - Testing of thyristor valves

€12.00

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IEC 60749-43:2017

IEC 60749-43:2017

Superseded Historical

IEC 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

€302.00

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IEC 60050-521:2002/AMD1:2017

IEC 60050-521:2002/AMD1:2017

Active Most Recent

IEC 60050-521:2002/AMD1:2017 Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

€12.00

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IEC 60749-12:2017

IEC 60749-12:2017

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IEC 60749-12:2017 Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

€23.00

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IEC 62969-2:2018

IEC 62969-2:2018

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IEC 62969-2:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors

€46.00

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IEC 62969-3:2018

IEC 62969-3:2018

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IEC 62969-3:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors

€186.00

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IEC 62969-4:2018

IEC 62969-4:2018

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IEC 62969-4:2018 Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

€133.00

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IEC 60050-523:2018

IEC 60050-523:2018

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IEC 60050-523:2018 International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices

€186.00

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IEC 60050-521:2002/AMD2:2018

IEC 60050-521:2002/AMD2:2018

Active Most Recent

IEC 60050-521:2002/AMD2:2018 Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits

€12.00

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