Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of arsenic in silicon
€113.00
Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
This product is not for sale, please contact us for more information
Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
€152.00
Laboratory glassware Desiccators
€75.00
Gas mixtures — Gravimetric preparation — Mastering correlations in composition
€0.00
Abstract General information
Gas analysis — Contents of certificates for calibration gas mixtures
Gas analysis — Preparation of calibration gas mixtures using dynamic methods
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
€204.00
Surface chemical analysis — Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
€254.00
Surface chemical analysis — Characterization of nanostructured materials
Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
€178.00
Microbeam analysis — EMSA/MAS standard file format for spectral-data exchange
