Superseded
, Confirmed
Standard
Historical
ASTM F1709-97(2002)
Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Summary
1.1 This specification covers pure titanium sputtering targets used as a raw material in fabricating semiconductor electronic devices.
1.2 This standard sets purity grade levels, physical attributes, analytical methods, and packaging.
1.2.1 The grade designation is a measure of total metallic impurity content. The grade designation does not necessarily indicate suitability for a particular application because factors other than total metallic impurity may influence performance.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 01/01/1996 |
| Confirmation Date | 12/10/2002 |
| Collection | |
| Page Count | 3 |
| Themes | Electronic display devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
01/01/1996
Superseded
Historical
Previous versions
01/01/1996
Withdrawn
, Confirmed
Most Recent
01/01/1996
Superseded
Historical
01/01/1996
Superseded
, Confirmed
Historical
01/01/1996
Superseded
, Confirmed
Historical