DIN 50441-4:1999-03
Withdrawn Standard
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DIN 50441-4:1999-03

Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth
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Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 03/01/1999
Page Count 8
EAN ---
ISBN ---
Weight (in grams) ---
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